Electrical rapid pulse group test
electrical rapid pulse group test
The purpose of the electrical rapid pulse group test is to test the performance of electronic and electrical equipment under the influence of this kind of transient disturbance. A repetitive fast transient test is a test in which a burst of many fast transient pulses is coupled to the power, signal and control ports of electrical and electronic equipment. The main points of the test are the short rise time, repetition rate and low energy of the transient.
Electrical fast transient pulse group ((EFT/B, Electrical Fast Transient / Burst) is in the same power supply circuit, a variety of electrical appliances (or equipment) in the working process (such as switches, relays, etc. in use) generated transient pulse group. If the inductive load is repeatedly switched several times, the pulse train will be repeated several times at corresponding time intervals. This kind of pulse has short rise time, high repetition rate, low energy and wide spectrum distribution. Pulse group interference will use electrical appliances (or equipment) performance degradation or failure.
A repetitive fast transient test is a test in which a burst of many fast transient pulses is coupled to the power, signal, and control ports of electrical and electronic equipment. The main points of the test are the short rise time, repetition rate and low energy of the transient. The purpose is to evaluate the immunity of the equipment under test to transient bursts from operating transients (such as disconnected inductive loads, relay contact bouncing, etc.).
IEC 61000-4-4/GB T 17626.4: Electrical fast transient burst immunity test
The impulse group immunity test is to simulate the interference generated by many mechanical switches in the power grid when switching inductive loads. This type of interference is characterized by narrow pulses appearing in groups, high pulse repetition frequency (kHz-MHz level), steep rising edge (ns level), short duration of a single pulse (10-100ns level), and amplitude reaching kV level.
The narrow pulses that appear in groups can charge the junction capacitance of the semiconductor device, and when the energy accumulates to a certain extent, it can cause errors in the line or equipment. During the test, the pulse is superimposed on the power line (through the coupling/decoupling network) and the communication line (through the capacitive coupling clamp), which interferes with the equipment.
The test part of the equipment under test (EUT) mainly includes the power supply port, protective ground (PE), signal and control port of the equipment.
detection technology
Tianhai detection EFT test system adopts 3C test's new test system EFT 500T, with a test voltage range of 0.2~4.8kV. at the same time, it is also equipped with three-phase five-wire coupling decoupling networks AC380V 32A, Max. 450V;DC 380V 32A, coupling clamp coupling capacitance is 100pF ~ 1000pF, diameter can reach 40mm, can meet the new version of EFT test.
Tianhai Testing Laboratory
Tianhai testing is set up and operated in accordance with the laboratory accreditation system specification ISO 17025. The testing instruments are made up of Germany's Rohde & Schwarz, Switzerland's EMTEST, YYOKOGAWA, Agilent, Tektronix and other world's top instrument manufacturers. The equipment is advanced and sophisticated, the site environment control is reliable, traceability is strong, the technical team is senior and efficient, and close cooperation with international authoritative organizations is maintained.
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