Voltage Fluctuation and Flicker Test
Pressure Fluctuation and Flicker Test Basis Standard
IEC 61000-3-3/GB 17625.2: Limitation of voltage fluctuation and flicker in low voltage power supply system for equipment with rated current not more than 16A;
Voltage Fluctuation and Flicker Test
The change in the grid voltage caused by the EUT is mainly measured. The interference effect of voltage change depends not only on the amplitude of voltage change, but also on the frequency of its occurrence. Voltage change is usually evaluated by two indicators, namely voltage fluctuation and flicker.
The voltage fluctuation index reflects the sudden large voltage change, while the flicker index reflects the continuous voltage change over a period of time. In the voltage fluctuation and flicker circuit, the reference impedance Z (at 50Hz) of the power supply S consists of: RA = 0.24 Ω,jXN = 0.15 Ω;RN = 0.16 Ω,jXN = 0.10 Ω.
detection technology
Tianhai detection harmonic current test system adopts the new test system of American AMETEK CI, which can meet the new version of harmonic current, voltage fluctuation and flicker test.
Tianhai Testing Laboratory
Tianhai testing is set up and operated in accordance with the laboratory accreditation system specification ISO 17025. The testing instruments are made up of Germany's Rohde & Schwarz, Switzerland's EMTEST, YYOKOGAWA, Agilent, Tektronix and other world's top instrument manufacturers. The equipment is advanced and sophisticated, the site environment control is reliable, traceability is strong, the technical team is senior and efficient, and close cooperation with international authoritative organizations is maintained.
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